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US 2023/0408573 A1Published application
System and method for testing optical receivers
AssigneeMellanox Technologies, Ltd.
InventorsTatyana Antonenko, Yaakov GRIDISH, Tamir SHARKAZ, Itshak KALIFA, Elad MENTOVICH
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Abstract
Disclosed are a testing unit, system, and method for testing and predicting failure of optical receivers. The testing unit and system are configured to apply different values of current, voltage, heat stress, and illumination load on the optical receivers during testing. The test methods are designed to check dark current, photo current, forward voltage, and drift over time of these parameters.
Claims17
-34. (canceled)
A method for testing optical receivers, the method comprising:
- placing within a temperature controlled oven:
- a testing board configured to support at least one socket, wherein each socket is configured to receive a substrate configured to support at least one optical receiver;
- and
- an emitter board configured to support at least one optical emitter,
- wherein the emitter board is supported above the testing board such that the emitter board is substantially parallel to the testing board and each of the one or more optical emitters on the emitter board is substantially aligned with a corresponding socket of the testing board;
- and
- performing one or more testing operations without removal of the testing board or the emitter board from the temperature controlled oven.
4 more elements
Dependencies are inferred from the claim text.