Temperature measurement calibration method without interference of shutter of thermal imaging module
AssigneeNational Chung Shan Institute of Science and Technology
InventorsSHIANG-FENG TANG, SHUN-LUNG YEN, KUO-JEN CHANG, HSIN-CHANG CHEN
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Abstract
A temperature measurement calibration method without interference of a shutter of a thermal imaging module comprises steps: at a temperature of a core chip of a thermal imaging module, obtaining a response value generated by measuring a blackbody temperature after the shutter is started at a frame time; performing a linear regression analysis of the response value to obtain a correction response value equation; inputting the response value into the correction response value equation; and obtaining a correction response value of measuring the blackbody temperature.
Claims6
A temperature measurement calibration method without interference of a shutter of a thermal imaging module, comprising steps:
- (S1) at a temperature of a core chip of a thermal imaging module, obtaining a response value generated by measuring a blackbody temperature after the shutter is started at a frame time;
- (S2) performing a linear regression analysis of the response value to obtain a correction response value equation;
- (S3) inputting the response value into the correction response value equation;
- and
- (S4) obtaining a correction response value of measuring the blackbody temperature.
Dependencies are inferred from the claim text.