Memory test drive
AssigneeSeoul National University R&Db Foundation
InventorsU KANG, Su Hyun CHAE, Jong Min PARK, Jun-Gi JANG, Ji Yong LEE, Sooyeon SHIM, Vladimir Vladimirovich EGAY
Life of this patent
Estimating the term…
Abstract
A memory test device is provided including a command feature vector extractor and an address feature vector extractor. The command feature vector extractor extracts a command feature vector, based commands executed on memory cells among a plurality of memory cells. The address feature vector extractor extracts an address feature vector, based on address-related information indicating locations of the memory cells executing the commands.
Claims20
A memory test device comprising:
- a command feature vector extractor that extracts a command feature vector, based on commands executed on memory cells among a plurality of memory cells;
- and
- an address feature vector extractor that extracts an address feature vector, based on address-related information indicating locations of the memory cells executing the commands.
A memory test device comprising:
- a class detector that divides workloads of a plurality of memory cells into a known workload and an unknown workload, based on a feature vector generated from a workload sequence of the plurality of memory cells,
- wherein the workload sequence includes commands executed on memory cells among the plurality of memory cells and address-related information indicating locations of the memory cells executing the commands.
A memory test device comprising:
- a feature vector extractor that includes a command feature vector extractor configured to extract a command feature vector based on commands executed by memory cells among a plurality of memory cells, and an address feature vector extractor configured to extract an address feature vector based on address-related information of the memory cells accessed by the commands;
- and
- a class detector that classifies workloads of the memory cells into a known workload and an unknown workload, based on a feature vector including the command feature vector and the address feature vector.
Dependencies are inferred from the claim text.