Pin Testing System for Multi-Pin Chip and Method Thereof

A pin testing method for multi-pin chip, comprising:

• providing a chip testing circuit board comprising a testing circuit, a to-be-tested chip fixture, a testing chip and a JTAG port;
• electrically connecting the to-be-tested chip fixture to the testing circuit, and clamping and fastening a to-be-tested chip, by the to-be-tested chip fixture;
• electrically connecting the testing chip to the testing circuit, wherein each of pins of the testing chip is electrically connected to a corresponding one of pins of the to-be-tested chip fixture through the testing circuit;
• serially connecting the JTAG port, the testing chip and the to-be-tested chip fixture to form a JTAG link, through the testing circuit;
• electrically connecting a JTAG controller to the JTAG port;
• and
• electrically connecting a testing device to the JTAG controller, wherein the testing device is configured to generate a testing signal;
• wherein the testing device transmits the testing signal to the JTAG controller, the JTAG controller transmits the testing signal to the chip testing circuit board, the chip testing circuit board performs testing on one of the pins of the to-be-tested chip based on the testing signal, and transmits a testing result to the testing device, so as to complete the testing on the pins of the to-be-tested chip.