Component Analysis Apparatus and Component Analysis Method
AssigneeHitachi High-Tech Corporation
InventorYoshiki YONAMOTO
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Abstract
To provide an optical nuclear magnetic resonance apparatus in which a cleaning mechanism that can be mounted on an apparatus for performing an optical magnetic resonance method and can remove deposits on a sensor surface is mounted, and removal of contamination of the sensor surface can be determined. In a component analysis apparatus according to the present invention, a sensor includes therein a defect having an electron spin that causes electron spin resonance, an orientation of the electron spin can be optically detected, and an ozone generation device and an oxygen radical generation device are driven during washing of the sensor.
Claims11
A component analysis apparatus comprising:
- a sensor configured to detect a nuclear magnetic field of a sample while being in contact with the sample;
- an ozone generation device configured to generate ozone;
- and
- an oxygen radical generation device configured to decompose ozone to generate oxygen radicals, wherein
- the sensor has an electron spin that causes electron spin resonance with a nuclear spin of the sample,
- an orientation of the electron spin can be optically detected, and
- the ozone generation device and the oxygen radical generation device are driven during washing of the sensor.
A component analysis method for washing a sensor in a component analysis apparatus,
- the sensor having an electron spin that causes electron spin resonance with a nuclear spin of a sample, and
- an orientation of the electron spin being detectable optically,
- the method comprising:
- generating ozone in a chamber in which the sensor is accommodated;
- and
- decomposing ozone to generate oxygen radicals in the chamber.
Dependencies are inferred from the claim text.