Hard mask deposition using direct current superimposed radio frequency plasma
AssigneeTokyo Electron Limited
InventorsJianping Zhao, Peter Lowell George Ventzek, Toshihiko Iwao
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AssigneeTokyo Electron Limited
InventorsJianping Zhao, Peter Lowell George Ventzek, Toshihiko Iwao
Estimating the term…
A plasma processing apparatus includes a plasma processing chamber, a substrate holder disposed in the chamber, and a radio frequency (RF) electrode disposed within the chamber, an RF power source configured to supply continuous wave RF power having frequency in the very high frequency range to the RF electrode, and a direct current (DC) power source configured to supply continuous wave DC power to the chamber through an RF choke. The DC power is supplied concurrently with the RF power. The RF power source is electrically coupled to the RF electrode through an impedance matching circuit and is separate from the DC power source. The RF electrode may be an upper electrode or a lower electrode, such as the substrate holder. The DC power may be supplied to an upper or lower electrode, or through a wall of the chamber.
A plasma processing apparatus comprising:
A plasma processing apparatus comprising:
A plasma processing apparatus comprising:
Dependencies are inferred from the claim text.