Oxide film preparation method
AssigneeBeijing Naura Microelectronics Equipment Co., Ltd.
InventorJianheng LUO
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AssigneeBeijing Naura Microelectronics Equipment Co., Ltd.
InventorJianheng LUO
Estimating the term…
The oxide film preparation method of the present disclosure includes placing a wafer that is to be deposited with a film in a reaction chamber, introducing a first mixed gas of a bombardment gas and an oxidization gas into the reaction chamber, applying DC power and radio frequency power to the target, exciting the first mixed gas to form a plasma to bombard the target to form an oxide film on the wafer, stopping applying the DC power and the RF power on the target, introducing a second mixed gas of the bombardment gas, the oxidization gas, and nitrogen into the reaction chamber, applying the RF power to the base, exciting the second mixed gas to form the plasma to bombard the oxide film to form an oxynitride film, continuing to introduce the second mixed gas to the reaction chamber, exciting the second mixed gas to form the plasma to bombard the target and the oxynitride film formed in step 3 to form an oxynitride film on the oxynitride film formed in step 3.
An oxide film preparation method comprising:
Dependencies are inferred from the claim text.