Calculation device and method for extracting feature of measurement data by using same
AssigneeR.T.M. S.P.A.
InventorsSang Yeop KIM, Jin Woo PARK
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Abstract
According to the present disclosure, a method of extracting a feature of measurement data using a computing apparatus may include identifying measurement data obtained during a process, identifying target data related to the measurement data, performing a computation on the measurement data based on the target data, extracting a plurality of first values by applying a max pooling layer to the computed measurement data, extracting a plurality of second values by applying a min pooling layer to the computed measurement data, and extracting a plurality of third values related to a feature of the measurement data using the plurality of first values and the plurality of second values.
Claims20
A method of extracting a feature of measurement data using a computing apparatus, the method comprising:
- identifying measurement data obtained during a process;
- identifying target data related to the measurement data;
- performing a computation on the measurement data based on the target data;
- extracting a plurality of first values by applying a max pooling layer to the computed measurement data;
- extracting a plurality of second values by applying a min pooling layer to the computed measurement data;
- and
- extracting a plurality of third values related to a feature of the measurement data using the plurality of first values and the plurality of second values.
A non-transitory computer-readable recording medium having contents configured to cause a computing system to perform a method, the method comprising:
- identifying measurement data obtained during a process;
- identifying target data related to the measurement data;
- performing a computation on the measurement data based on the target data;
- extracting a plurality of first values by applying a max pooling layer to the computed measurement data;
- extracting a plurality of second values by applying a min pooling layer to the computed measurement data;
- and
- extracting a plurality of third values related to a feature of the measurement data using the plurality of first values and the plurality of second values.
A computing apparatus for extracting a feature of measurement data, the computing apparatus comprising:
- a memory in which a computer-readable instruction is stored;
- and
- a processor connected to the memory,
- wherein the processor is configured to:
- identify the measurement data obtained during a process;
- identify target data related to the measurement data;
- perform a computation on the measurement data based on the target data;
- extract a plurality of first values by applying a max pooling layer to the computed measurement data;
- extract a plurality of second values by applying a min pooling layer to the computed measurement data;
- and
- extract a plurality of third values related to a feature of the measurement data using the plurality of first values and the plurality of second values.
Dependencies are inferred from the claim text.