Apparatus and method for measuring properties of polymer
AssigneesSamsung Electronics Co., Ltd., Iucf-Hyu (Industry-University Cooperation Foundation Hanyang University)
InventorsHansung RYU, Haksung KIM, Gyunghwan OH, Heonsu KIM, Dongwoon PARK, Jeonghyeon BAEK
Life of this patent
Estimating the term…