Film forming method
AssigneeTokyo Electron Limited
InventorsKouji SHIMOMURA, Yoshihiro KATO, Toshio HASEGAWA, Junya SUZUKI
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AssigneeTokyo Electron Limited
InventorsKouji SHIMOMURA, Yoshihiro KATO, Toshio HASEGAWA, Junya SUZUKI
Estimating the term…
A film forming method of forming a metal-containing aluminum oxide layer on a substrate having at least a metal layer on a surface thereof includes: a first operation of forming an aluminum oxide layer on the substrate with an aluminum-containing precursor and an oxidant; and a second operation of forming a metal oxide layer on the substrate with the oxidant and a precursor including a first metal other than aluminum. Assuming that a dielectric constant of only an oxide of the first metal is ε1 and a molar ratio of the first metal to all metals in the metal-containing aluminum oxide layer is X, the formed metal-containing aluminum oxide layer satisfies a following condition (1) or (2): X>⅓ and ε1<25×X/(3X−1) . . . (1); and X≤⅓. . . (2).
1-14. (canceled)
A film forming method of forming a metal-containing aluminum oxide layer on a substrate having at least a metal layer on a surface thereof, the method comprising:
Dependencies are inferred from the claim text.