Analyzer and method for analyzing a sample

A method of analyzing a sample, the method comprising:

• providing a sample on a substrate;
• irradiating the sample with at least three incident beams of light, wherein each of the incident beams comprises light of a different frequency, and is transmitted towards the sample along the same or substantially the same axis, and wherein the sample is substantially transmissive at each of the different frequencies;
• providing a light sensing arrangement to receive light patterns from the incident beams that have passed through the substrate;
• and
• analyzing properties of the sample through identifying properties of the light patterns arising from diffraction of the light of the three incident beams by the sample,
• wherein the incident beams comprise light of a first frequency, a second frequency and a third frequency, and wherein a difference in frequency between the first frequency and the second frequency is the same or substantially the same as a difference in frequency between the second frequency and the third frequency.

An analyzer, comprising:

• a holding arrangement to retain a slide carrier;
• an illumination arrangement provided on a first side of the holding arrangement;
• and
• a light sensing arrangement provided on a second side of the holding arrangement, substantially opposite to the first side, wherein:
• the illumination arrangement is configured to direct at least three incident light beams towards the holding arrangement along the same or substantially the same axis, wherein the incident light beams have different frequencies from each other, the illumination arrangement including a first light emitting element, a second light emitting element, and a third light emitting element,
• the light sensing arrangement comprises an array of light sensing elements which are configured to detect light of the different frequencies of the incident light beams, and
• a difference between a wavelength of the light emitted by the first light emitting element and a wavelength of the light emitted by the second light emitting element is the same or substantially the same as a difference between the wavelength of the light emitted by the second light emitting element and a wavelength of the light emitted by the third light emitting element.