Methods for depositing gap-filling fluids and related systems and devices
AssigneeASM IP Holding B.V.
InventorsRanjit Borude, Shinya Yoshimoto, Makoto Igarashi, Jhoelle Roche Guhit, Pamarti Viswanath
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Abstract
Methods and related systems for at least partially filling recesses comprised in a substrate with a gap filling fluid. The gap filling fluid comprises a Si—N bond. The methods comprise exposing the substrate to a nitrogen and hydrogen-containing gas on the one hand and to vacuum ultraviolet light on the other hand.
Claims20
A method of curing a gap filling fluid, the method comprising:
- introducing in a process chamber a substrate provided with a gap, the gap comprising a gap filling fluid, the gap filling fluid comprising a Si—N bond;
- and
- simultaneously exposing the substrate to vacuum ultraviolet radiation and to an ambient gas;
- thereby curing the gap filling fluid and forming silicon nitride in the gap.
A method of filling a gap comprising:
- introducing a substrate provided with a gap into a process system;
- executing one or more cycles, a cycle comprising a deposition step and a curing step, the deposition step comprising:
- providing a precursor, the precursor comprising silicon, nitrogen, and hydrogen;
- providing a reactant, wherein the reactant comprises one or more of nitrogen, hydrogen, and a noble gas;
- and,
- generating a plasma;
- whereby the plasma causes the precursor and the reactant to react to form a gap filling fluid that at least partially fills the gap, the gap filling fluid comprising a Si—N bond;
- the curing step comprising:
- simultaneously exposing the substrate to vacuum ultraviolet radiation and to an ambient gas, thereby curing the gap filling fluid and forming silicon nitride in the gap, wherein the ambient gas is a nitrogen and hydrogen-containing gas or an argon-containing gas.
A processing system comprising a first process chamber, a precursor source, a precursor line, an ammonia source, an ammonia line, and a vacuum ultraviolet light source;
- wherein
- the precursor source comprises a precursor, the precursor comprising a Si—N bond;
- the precursor line being arranged for providing the precursor from the precursor source to the first process chamber;
- the ammonia line being arranged for providing ammonia from the ammonia source to the first process chamber;
- and,
- the vacuum ultraviolet light source being arranged for generating vacuum ultraviolet light.
Dependencies are inferred from the claim text.