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US 2023/0290286 A1Published application
Pixel structure for repairing defects for micro device integrated systems
AssigneeVueReal Inc.
InventorGHOLAMREZA CHAJI
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Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Claims7
A method of extracting and identifying defects in at least one micro device parameter, the method comprising:
- coupling a micro device having a first electrode to a test capacitor;
- coupling the test capacitor to a first time varying test signal;
- measuring an at least one signal from the micro device;
- and
- extracting the at least one micro device parameter.
2 more elements
Dependencies are inferred from the claim text.