Method and apparatus of analyzing data, and storage medium
AssigneeChangxin Memory Technologies, Inc.
InventorHuan LU
Life of this patent
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Abstract
Embodiments of the present disclosure relate to a method and an apparatus of analyzing data, and a storage medium. The method of analyzing data includes: obtaining a single shmoo plot of each pin of a memory particle; and constructing an integrated shmoo plot of the memory particle based on the single shmoo plot of each of the pins, wherein each test point of the integrated shmoo plot is marked with a pass proportion, and the pass proportion is configured to represent a proportion of a quantity of passed single shmoo plots at a corresponding test point to a total quantity of the single shmoo plots.
Claims19
A method of analyzing data, comprising:
- obtaining a single shmoo plot of each pin of a memory particle;
- and
- constructing an integrated shmoo plot of the memory particle based on the single shmoo plot of each of the pins, wherein each test point of the integrated shmoo plot is marked with a pass proportion, and the pass proportion is configured to represent a proportion of a quantity of passed single shmoo plots at a corresponding test point to a total quantity of the single shmoo plots.
A method of analyzing data, comprising:
- obtaining a single shmoo plot of any one of a plurality of memory particles;
- and
- constructing an integrated shmoo plot of a memory based on the single shmoo plots of the memory particles, wherein each test point of the integrated shmoo plot is marked with a third identifier, and the third identifier is configured to represent a code of a passed memory particle at a corresponding test point.
An apparatus of analyzing data, comprising a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement:
- obtaining a single shmoo plot of each pin of a memory particle;
- and
- constructing an integrated shmoo plot of the memory particle based on the single shmoo plot of each of the pins, wherein each test point of the integrated shmoo plot is marked with a pass proportion, and the pass proportion is configured to represent a proportion of a quantity of passed single shmoo plots at a corresponding test point to a total quantity of the single shmoo plots.
Dependencies are inferred from the claim text.