Observation apparatus and method of visualizing phase object
AssigneeEvident Corporation
InventorTadashi HIRATA
Life of this patent
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Abstract
An observation apparatus includes: an illumination optical system provided below an installation position of a multi-well plate; a reflector provided above the installation position, the reflector being configured to reflect light emitted from the illumination optical system; and an observation optical system provided below the installation position, the observation optical system being configured to condense the light reflected by the reflector. The reflector is installed such that a marginal ray to enter the observation optical system travels via a peripheral well different from an on-axis well located on an optical axis of the observation optical system before reflection due to the reflector.
Claims20
An observation apparatus comprising:
- an illumination optical system provided below an installation position of a multi-well plate;
- a reflector provided above the installation position, the reflector being configured to reflect light emitted from the illumination optical system;
- and
- an observation optical system provided below the installation position, the observation optical system being configured to condense the light reflected by the reflector, wherein
- the reflector is installed such that a marginal ray to enter the observation optical system travels via a peripheral well different from an on-axis well located on an optical axis of the observation optical system before reflection due to the reflector.
A method of visualizing a phase object housed in a multi-well plate, the method comprising:
- emitting light from an illumination optical system provided below an installation position of the multi-well plate to the multi-well plate;
- reflecting the light emitted from the illumination optical system with a reflector provided above the installation position;
- and
- condensing the light reflected by the reflector with an observation optical system provided below the installation position, wherein
- the reflecting the light emitted from the illumination optical system includes causing light having traveled via a peripheral well different from an on-axis well located on an optical axis of the observation optical system before reflection due to the reflector, to enter, as a marginal ray, the observation optical system.
Dependencies are inferred from the claim text.