Spectrometer-less sample analysis system and method using high wavenumber raman scattering

A system for analyzing a sample material using Raman spectral light, comprising:

• at least one light source configured to produce excitation light at one or more wavelengths;
• at least one light detector;
• at least one narrow band pass filter;
• wherein the system is configured such that excitation light produced by the light source is directed to the sample material to interrogate the sample material, and the at least one narrow band pass filter is positioned to receive Raman scattered light produced as a result of the excitation light interrogation, and the at least one detector is positioned to receive the Raman scattered light that has passed through the at least one narrow band pass filter;
• and
• an analyzer in communication with the light source and the at least one light detector and a memory storing instructions, which instructions when executed cause the analyzer to:
• control the light source to produce excitation light at the one or more wavelengths;
• and
• process signals produced by the light detector to analyze the sample material, the signals representative of an intensity of the Raman scattered light received by the at least one light detector corresponding to one or more wavenumbers in a high wavenumber region of a Raman spectrum.