Method for producing a sample on an object, computer program product, and material processing device for carrying out the method
AssigneeCarl Zeiss Microscopy GmbH
InventorHeiko Stegmann
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AssigneeCarl Zeiss Microscopy GmbH
InventorHeiko Stegmann
Estimating the term…
The invention relates to a method for producing a sample on an object using a material processing device. The invention further relates to a computer program product and a material processing device for carrying out the method. The method comprises guiding a light beam over a surface of the object in a first direction along a first line, with material of the object being ablated when the light beam is guided over the surface of the object, changing the first direction into a second direction, guiding the light beam over the surface of the object in the second direction along a second line, with material of the object being ablated when the light beam is guided over the surface of the object along the second line, wherein the light beam is provided in pulsed fashion and is guided onto the surface of the object in such a way that the light beam ablates material from the object in a first operational state of the light beam device and that the light beam is not guided onto the object in a second operational state, and wherein the sample is produced in the first operational state by ablating material from the object.
A method for producing at least one sample on an object using a material processing device having at least one light beam device that provides at least one light beam, the method comprising:
A non-transitory computer readable medium containing software, which can be loaded into a processor and which, when executed, causes a material processing device to produce at least one sample on an object by performing the following:
A material processing device for processing an object, comprising:
Dependencies are inferred from the claim text.