Improved ion conversion plate
OwnerRussell Jurek, Toby Shanleyinventors
Life of this patent
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Abstract
Scientific analytical equipment including apparatus and methods for detecting and quantitating particles, and particularly ions generated in the course of mass spectroscopy. In one version, a particle detection apparatus includes electron emissive surfaces which emit secondary electrons in response to impact with a particle, the apparatus maintaining spatial separation between: (i) secondary electrons emitted as a result of the impact of a first particle in a first region of the electron emissive surface; and (ii) secondary electrons emitted as a result of the impact of a second particle in a second region of the electron emissive surface.
Claims41
A particle detection apparatus comprising:
- a first electron emissive surface and a second electron emissive surface, each of the first and second electron emissive surfaces configured to emit secondary electrons in response to impact with a particle, wherein the apparatus is configured so as to maintain spatial separation between (i) secondary electrons emitted by the first electron emissive surface and (ii) secondary electrons emitted by the second electron emissive surface by electric field lines established above the first and second electron emissive surfaces.
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A method for the detection of particles, the method comprising:
- providing one or more electron emissive surfaces,
- establishing electric field lines above the one or more electron emissive surfaces to, spatially constrain secondary electrons emitted due to impact of a particle at a first position on the one or more electron emissive surfaces and spatially constraining secondary electrons emitted due to impact of a particle at a second position on the one or more electron emissive surfaces,
- causing or allowing -a particle to impact at a first position on the one or more electron emissive surfaces,
- causing or allowing -a particle to impact at a second position on the one or more electron emissive surfaces, and
- separately collecting secondary electrons emitted resulting from the particle impacting at the first position and secondary electrons resulting from the particle impacting at the second position.
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Dependencies are inferred from the claim text.