Methods and Systems for Performing On-The-Fly Automatic Calibration Adjustments of X-Ray Inspection Systems
AssigneeRapiscan Holdings, Inc.
InventorDan-Cristian Dinca
Life of this patent
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AssigneeRapiscan Holdings, Inc.
InventorDan-Cristian Dinca
Estimating the term…
The specification discloses methods of adjusting calibration data in an X-ray inspection system. Calibration data is initially generated. X-ray scan images of a cargo container are then acquired. Each of the X-ray scan images are segmented into regions of interest, where the regions of interest volumetrically encompass a known material or a material corresponding to a known HS code. Using the calibration data, first data indicative of Zeff of each of the regions of interest are determined. The first data is compared with second data indicative of known Zeff corresponding to the known materials and/or HS codes. The calibration data is then adjusted to generate a second calibration data if the first and second data differ significantly. The calibration data is replaced by the second calibration data in the memory.
A method of performing an on-the-fly adjustment of calibration data corresponding to an X-ray inspection system that comprises an X-ray source in data communication with a computing device, the method being implemented in the computing device having one or more physical processors programmed with a plurality of program instructions that, when executed by the one or more physical processors, cause the computing device to perform the method, the method comprising:
An X-ray inspection system comprising:
Dependencies are inferred from the claim text.