Apparatus and method for determining a characteristic of a material
AssigneeIndustrial Tomography Systems PLC
InventorsThomas David Machin, Hsin-Yu Wei
Life of this patent
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AssigneeIndustrial Tomography Systems PLC
InventorsThomas David Machin, Hsin-Yu Wei
Estimating the term…
An apparatus for determining a characteristic of a material within a region comprises a first plurality of electrodes disposed within or about the region, an energisation source arranged to apply an applied stimulation signal to at least one of said first plurality of electrodes, a stimulation monitor arranged to monitor an electrical parameter at a second plurality of said first plurality of electrodes in response to said applied stimulation signal, the stimulation monitor being configured to generate a received stimulation signal for each of said second plurality of electrodes, a monitor configured to generate a series of data values, each data value being indicative of a phase difference and/or an amplitude relationship between the applied stimulation signal and a received stimulation signal associated with one of the second plurality of electrodes, said series of data values defining an electromagnetic fingerprint, and a controller configured to: receive the electromagnetic fingerprint, identify an interrelationship between at least some of the data values of the electromagnetic fingerprint, and determine the characteristic based on the interrelationship.
1-52. (canceled)
An apparatus for determining a characteristic of a material within a region, the apparatus comprising:
A computer implemented method for determining a characteristic of a material within a region, the method comprising:
A method of determining a stability of a material within a region, the method comprising:
Dependencies are inferred from the claim text.