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US 2023/0146198 A1Published application
Multi-fraction sample holder for 3D particle analysis
AssigneeCarl Zeiss X-ray Microscopy, Inc.
InventorMatthew Andrew
Life of this patent
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Abstract
An x-ray minerology analysis system includes a sample assembly for an x-ray microscopy system. It comprises an outer tube and a bottom plug sealing an inner bore of the outer tube, wherein the outer tube contains powder to be analysed by the x-ray microscopy system.
Claims17
A sample assembly for an x-ray microscopy system, comprising:
- an outer tube;
- and
- a bottom plug sealing an inner bore of the outer tube, wherein the outer tube contains powder to be analyzed by the x-ray microscopy system.
An x-ray microscopy system, comprising:
- a source of generating x-rays;
- a sample holder for holding samples in the beam;
- a sample assembly held by the sample holder, including an outer tube that contains powder samples;
- and
- a detector for detecting the beam after interaction with the samples.
2 more elements
A method of operation of an x-ray microscopy system, the method comprising:
- generating x-rays;
- holding samples in the beam with a sample assembly including an outer tube containing powder samples;
- and
- detecting the beam after interaction with the samples.
1 more element
Dependencies are inferred from the claim text.