Substrate porosity determination
AssigneeHewlett-Packard Development Company, L.P.
InventorsLi Qian, Alberto Borrego Lebrato, David Munoz Navarro
Life of this patent
Estimating the term…
Abstract
Example implementations relate to substrate porosity determination. Some examples refer to a substrate porosity determination comprising an image capture device a controller to obtain a reference image by the image capture device; obtain a measurement image after a printing operation has been performed on a substrate located over the image capture device; compare the reference image and the measurement image—determine whether the substrate is porous based on the comparison; and determine a print parameter based on the determination of whether the substrate is porous.
Claims15
A device for substrate porosity determination comprising an image capture device a controller to:
- obtain a reference image by the image capture device;
- obtain a measurement image after a printing operation has been performed on a substrate located over the image capture device;
- compare the reference image and the measurement image
- determine whether the substrate is porous based on the comparison;
- and
- determine a print parameter based on the determination of whether the substrate is porous.
A non-transitory computer-readable storage medium including instructions that, when executed on a controller, cause the controller to:
- obtain a reference image;
- perform a print operation on a substrate over an image capture device;
- obtain a measurement image by the image capture device being the measurement image obtained after the performance of the print operation;
- and
- compare the reference image with the measurement image and, based on the comparison;
- calculate a porosity of the substrate.
- determine a print parameter based on the calculated porosity.
A porosity determination method comprising:
- obtain a reference image;
- perform a print operation on a substrate over an image capture device;
- obtain a measurement image by the image capture device being the measurement image obtained after the performance of the print operation;
- and
- compare the reference image with the measurement image and, based on the comparison, calculate a porosity of the substrate.
- determine a print parameter based on the calculated porosity.
Dependencies are inferred from the claim text.