Method of testing a suspend operation

A method of testing a suspend operation, comprising:

• designating a memory cell to perform a programming operation and an erase operation, and determining whether to automatically perform a resume operation after a read operation and the suspend operation on the memory cell;
• applying a programming command or an erase command;
• transferring a suspend sampling signal to a suspend command circuit to perform the suspend operation once at each of all suspend operation time points by using a suspend control circuit included in a sequence operation circuit;
• determining whether the suspend operation is completed at all of the suspend operation time points, using an internal suspend command generated based on the suspend sampling signal;
• and
• reading data stored in the memory cell.

A method of testing a suspend operation, comprising:

• setting a number of test cycles to perform a suspend test on a memory device including a memory cell area and a peripheral circuit area;
• performing a programming operation or an erase operation on the memory cell area;
• comparing the set number of test cycles with a number of the programming operation or the erase operation;
• performing the suspend test for all suspend operation time points included in a subsequent operation when the number of the programming operation or the erase operation is greater than the number of test cycles;
• and
• determining whether to perform the suspend operation in the peripheral circuit area based on a result of the suspend test.