Method and system for analytical X-ray calibration, reconstruction and indexing using simulation
AssigneeCarl Zeiss X-ray Microscopy, Inc.
InventorMatthew Andrew
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AssigneeCarl Zeiss X-ray Microscopy, Inc.
InventorMatthew Andrew
Estimating the term…
A mineral characterization method for an x-ray CT system comprises generating one or more volume datasets of a sample and identifying phases in the sample by correcting the datasets based on simulations. This can be employed with a polychromatic x-ray simulation and a highly controlled and well scaled implementation of analytical reconstruction to index materials of known composition to reconstructed grayscale intensities. An example of an application of this technology is in the field of mineral characterization on geoscience samples, where a single sample may consist of many individual mineral phases, of unknown distribution. Also addressed is a workflow for data correction and calibration such that acquisition related uncertainties are minimized and reconstructed intensity robustness maximized. This is achieved when some material of known transmission is in the field of view for every projection to create a reference path.
A material characterization method for an x-ray CT system, comprising:
An x-ray microscopy CT system, comprising:
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