Method for predicting vault after phakic intraocular lens and electronic device

A method for predicting a Vault after phakic intraocular lens, comprising the following steps of:

• step S1:
• obtaining a thickness LT of a to-be-corrected crystalline lens;
• step S2:
• obtaining a horizontal sulcus-to-sulcus STSH value and a vertical sulcus-to-sulcus STSV value corresponding to the to-be-corrected crystalline lens;
• step S3:
• collecting a size of a preset ICL lens, comprising a diameter ICL Size and an axial position ICL Ax of the ICL lens;
• step S4:
• calculating an effective sulcus-to-sulcus STS value at the axial position of the ICL lens by formulas (1) and (2) according to the STSH and the STSV:
• when ICL Ax≤90,
• STS=STSH−(STSH−STSV)×sin ICL Ax×1586.5÷1555 (1);
• and
• when ICL Ax>90,
• STS=STSH−(STSH−STSV)×sin(180−ICL Ax)×1586.5÷1555 (2);
• step S5:
• calculating a lens thickness influence factor LTF by formula (3) according to the LT:
• LTF=LT÷10+0.16 (3);
• step S6:
• calculating a Vault chord height h by formula (4) according to the ICL Size and the STS:
• h=(ICL Size−STS)0.7 (4);
• step S7:
• calculating the Vault by formula (5) according to the h and the LTF:
• Vault=h−LTF (5);
• and
• step S8:
• judging whether the Vault reaches a threshold:
• when the Vault does not reach the threshold, updating the diameter ICL Size and the axial position ICL Ax of the ICL lens, and entering the step S4.

A method for determining a lens size of phakic intraocular lens, comprising:

• step S1:
• obtaining a thickness LT of a to-be-corrected crystalline lens;
• step S2:
• obtaining a horizontal sulcus-to-sulcus STSH value and a vertical sulcus-to-sulcus STSV value corresponding to the to-be-corrected crystalline lens;
• step S3:
• collecting a size of a preset ICL lens, comprising a diameter ICL Size and an axial position ICL Ax of the ICL lens;
• step S4:
• calculating an effective sulcus-to-sulcus STS value at the axial position of the ICL lens by formulas (1) and (2) according to the STSH and the STSV:
• when ICL Ax≤90,
• STS=STSH−(STSH−STSV)×sin ICL Ax×1586.5÷1555 (1);
• and
• when ICL Ax>90,
• STS=STSH−(STSH−STSV)×sin(180−ICL Ax)×1586.5÷1555 (2);
• step S5:
• calculating a lens thickness influence factor LTF by formula (3) according to the LT:
• LTF=LT÷10+0.16 (3);
• step S6:
• calculating a Vault chord height h by formula (4) according to the ICL Size and the STS:
• h=(ICL Size−STS)0.7 (4);
• step S7:
• calculating the Vault by formula (5) according to the h and the LTF:
• Vault=h−LTF (5);
• and
• step S8:
• judging whether the Vault reaches a threshold:
• when the Vault does not reach the threshold, updating the diameter ICL Size and the axial position ICL Ax of the ICL lens, and entering the step S4.

An electronic device, comprising a processor, a memory and a human-computer interaction module;

• and data transmission being carried out among the processor, the memory and the human-computer interaction module, wherein:
• the human-computer interaction module is configured for inputting collected data and sending the collected data to the processor;
• the memory is configured for storing a computer program and related data;
• and
• the processor is configured for receiving the data input by the human-computer interaction module, and executing the program stored in the memory;
• and when receiving the data input by the human-computer interaction module, implementing the following steps of:
• step S1:
• obtaining a thickness LT of a to-be-corrected crystalline lens;
• step S2:
• obtaining a horizontal sulcus-to-sulcus (STSH) value and a vertical sulcus-to-sulcus (STSV) value corresponding to the to-be-corrected crystalline lens;
• step S3:
• collecting a size of a preset ICL lens, comprising a diameter ICL Size and an axial position ICL Ax of the ICL lens;
• when executing the program stored in the memory, implementing the following steps of:
• step S4:
• calculating an effective sulcus-to-sulcus STS value at the axial position of the ICL lens by formulas (1) and (2) according to the STSH and the STSV:
• when ICL Ax≤90,
• STS=STSH−(STSH−STSV)×sin ICL Ax×1586.5÷1555 (1);
• and
• when ICL Ax>90,
• STS=STSH−(STSH−STSV)×sin(180−ICL Ax)×1586.5÷1555 (2);
• wherein in the step, formula parameters are determined through a lot of experiments and theoretical derivation;
• step S5:
• calculating a lens thickness influence factor LTF by formula (3) according to the LT:
• LTF=LT÷10+0.16 (3);
• step S6:
• calculating a Vault chord height h by formula (4) according to the ICL Size and the STS:
• h=(ICL Size−STS)0.7 (4);
• step S7:
• calculating the Vault by formula (5) according to the h and the LTF:
• Vault=h−LTF (5);
• and
• step S8:
• judging whether the Vault reaches a threshold:
• when the Vault does not reach the threshold, updating the diameter ICL Size and the axial position ICL Ax of the ICL lens, and entering the step S4.