Dc plasma control for electron enhanced material processing
AssigneeVelvetch LLC
InventorsWilliam Andrew Goddard, Stewart Francis Sando, Samir John Anz, David Irwin Margolese
Life of this patent
Estimating the term…
Loading patent…
AssigneeVelvetch LLC
InventorsWilliam Andrew Goddard, Stewart Francis Sando, Samir John Anz, David Irwin Margolese
Estimating the term…
Systems and methods for material processing using wafer scale waves of precisely controlled electrons in a DC plasma is presented. The anode and cathode of a DC plasma chamber are respectively connected to an adjustable DC voltage source and a DC current source. The anode potential is adjusted to shift a surface floating potential of a stage in a positive column of the DC plasma to a reference ground potential of the DC voltage/current sources. A conductive plate in a same region of the positive column opposite the stage is used to measure the surface floating potential of the stage. A signal generator referenced to the ground potential is capacitively coupled to the stage to control a surface potential at the stage for provision of kinetic energy to free electrons in the DC plasma.
A direct-current (DC) plasma system for processing of a substrate, comprising:
The direct-current (DC) plasma system of claim 11, wherein:
The direct-current (DC) plasma system of claim 11, wherein:
Dependencies are inferred from the claim text.