Active temperature control for rf window in immersed antenna source
AssigneeApplied Materials, Inc.
InventorsAdam Calkins, Jeffrey E. Krampert
Life of this patent
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AssigneeApplied Materials, Inc.
InventorsAdam Calkins, Jeffrey E. Krampert
Estimating the term…
A processing system including an ion source having a plasma chamber to house a plasma, an extraction assembly, disposed along a side of the plasma chamber, and including at least one extraction aperture, and an antenna assembly extending through the plasma chamber. The antenna assembly may include a dielectric enclosure and a plurality of conductive antennas extending through the dielectric enclosure, the conductive antennas having respective gas ports formed therein for delivering a gas into the dielectric enclosure. The processing system may further include a temperature regulation system coupled to the conductive antennas and to the dielectric enclosure for monitoring a temperature of the dielectric enclosure and regulating the gas delivered to the conductive antennas for regulating the temperature of the dielectric enclosure.
An ion source, comprising:
A processing system, comprising:
A method of regulating a temperature within a plasma chamber of an ion source, the method comprising:
Dependencies are inferred from the claim text.