System and method for characterizing a physical property of a sample

A method of characterizing a physical property of a sample using a microelectromechanical system (MEMS) device having a framework, a shuttle member being longitudinally movable within the framework, and a socket positioned adjacent a tip of the shuttle member, and a separate MEMS chip, the method comprising:

• depositing the sample onto the MEMS chip;
• loading the MEMS chip into the socket of the MEMS device;
• while applying a longitudinal force onto the MEMS chip via the shuttle member, generating a first signal indicative of the longitudinal force exerted onto the MEMS chip and a second signal indicative of the movement of the shuttle member;
• and
• characterizing at least a physical property of the sample based on the first and second signals.

A system for characterizing a physical property of a sample, the system comprising:

• a microelectromechanical system (MEMS) device having
• a framework,
• a shuttle member extending along a longitudinal orientation within the framework,
• obliquely extending arms extending between the framework and the shuttle member, the obliquely extending arms configured for expanding when actuated, said expanding applying a force onto the shuttle member and moving the shuttle member at least partly in the longitudinal orientation, and
• a socket positioned adjacent a tip of the shuttle member;
• and
• a MEMS chip receiving the sample and being configured for insertion into the socket.