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US 2023/0063072 A1Published application
Analysis device
AssigneeKabushiki Kaisha Toshiba
InventorsShinji SAITO, Yoichiro KURITA, Rei HASHIMOTO, Kei KANEKO, Takayoshi FUJII
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Abstract
An analysis device includes a substrate including a first surface, and a second surface positioned at a side opposite to the first surface; a light source part located at the first surface of the substrate, the light source part including a quantum cascade laser; a light detector located at the first surface of the substrate; and a wiring part located at the first surface of the substrate, the wiring part being electrically connected with the light source part and the light detector.
Claims11
An analysis device, comprising:
- a substrate including
- a first surface, and
- a second surface positioned at a side opposite to the first surface;
- a light source part located at the first surface of the substrate, the light source part including a quantum cascade laser;
- a light detector located at the first surface of the substrate;
- and
- a wiring part located at the first surface of the substrate, the wiring part being electrically connected with the light source part and the light detector.
4 more elements
An analysis device, comprising:
- a substrate including
- a first surface, and
- a second surface positioned at a side opposite to the first surface;
- a quantum cascade element located at the first surface of the substrate, the quantum cascade element being used as a light source part and a light detector;
- and
- a wiring part located at the first surface of the substrate, the wiring part being electrically connected with the quantum cascade element.
3 more elements
Dependencies are inferred from the claim text.