# US 2023/0055833 A1 · Parameter setting method and apparatus, system, and storage medium

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- Number: US 2023/0055833 A1
- Document ID: US20230055833A1
- Status: Published application
- Kind: A1
- Application number: 17/442,263
- Filed: 2021-06-17
- Published: 2023-02-23
- Earliest claimed: 2020-09-27
- Assignees: Changxin Memory Technologies, Inc.
- Applicants: Changxin Memory Technologies, Inc.
- Inventors: Hao He
- Web page: https://patentgrep.com/patent/US20230055833A1

## CPC

- G01R 31/31813: {Test pattern generators}
- G11C 29/56: External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G01R 31/2889: {Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence)}
- G01R 31/318314: {Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages (simulation software G01R31/318357; emulators G06F11/261)}
- G06F 11/22: Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G11C 29/56012: {Timing aspects, clock generation, synchronisation}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G11C: STATIC STORES (semiconductor memory devices H10B)
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)

## Abstract

The present application provides a parameter setting method and apparatus, a system, and a storage medium. The parameter setting method includes: obtaining first setting values of multiple memory parameters and storage locations of the multiple memory parameters in a non-volatile memory; generating a first parameter setting instruction according to the first setting value and the storage location of each memory parameter; and sending the first parameter setting instruction to a test device, so that the test device sets the memory parameter stored at the storage location in the non-volatile memory as the first setting value.

## Claims

### Claim 1

A parameter setting method, wherein the parameter setting method is applied to a host computer, the host computer is connected to a test device, and the test device comprises a non-volatile memory; and the parameter setting method comprises:
obtaining first setting values of multiple memory parameters and storage locations of the multiple memory parameters in the non-volatile memory;
generating a first parameter setting instruction according to the first setting value and the storage location of each memory parameter; and
sending the first parameter setting instruction to the test device, so that the test device sets the memory parameter stored at the storage location in the non-volatile memory as the first setting value.

### Claim 2 (depends on 1)

The parameter setting method according to claim 1, wherein the obtaining storage locations of the multiple memory parameters in the non-volatile memory comprises:
obtaining first data and second data for each memory parameter, wherein the first data is data stored in the non-volatile memory before the memory parameter is set, and the second data is data stored in the non-volatile memory after the memory parameter is set; and
obtaining a storage location of the memory parameter in the non-volatile memory according to the first data and the second data.

### Claim 3 (depends on 2)

The parameter setting method according to claim 2, wherein the obtaining second data comprises:
controlling the test device to obtain a second setting value of the memory parameter, wherein the second setting value is input by a display interface;
generating a second parameter setting instruction according to the second setting value and a preset instruction template, wherein the second parameter setting instruction is used to set the memory parameter stored in the non-volatile memory; and
obtaining the second data stored in the non-volatile memory after the test device executes the second parameter setting instruction.

### Claim 4 (depends on 3)

The parameter setting method according to claim 3, wherein the obtaining the second data stored in the non-volatile memory after the test device executes the second parameter setting instruction comprises:
obtaining the second data stored in a first memory area and a second memory area after the test device executes the second parameter setting instruction, wherein
the non-volatile memory comprises the first memory area and the second memory area, the first memory area is used to store control parameters, and the second memory area is used to store system variables.

### Claim 5 (depends on 4)

The parameter setting method according to claim 4, wherein the obtaining first data comprises:
obtaining the first data stored in the first memory area and the second memory area before the memory parameter is set.

### Claim 6 (depends on 2)

The parameter setting method according to claim 2, wherein the obtaining a storage location of the memory parameter in the non-volatile memory according to the first data and the second data comprises:
comparing the first data and the second data, to obtain a changed parameter; and
obtaining the storage location of the memory parameter in the non-volatile memory according to a storage location of the changed parameter in the first data or the second data.

### Claim 7 (depends on 1)

The parameter setting method according to claim 1, wherein the obtaining first setting values of multiple memory parameters and storage locations of the multiple memory parameters in the non-volatile memory comprises:
obtaining first setting values of some memory parameters stored in the non-volatile memory and storage locations of the memory parameters in the non-volatile memory.

### Claim 8 (depends on 1)

The parameter setting method according to claim 1, wherein the parameter setting method further comprises:
generating a configuration file according to the first setting value and the storage location of each memory parameter; and
sending the configuration file to the test device, wherein the first parameter setting instruction is used to instruct the test device to set the memory parameter according to the configuration file.

### Claim 9 (depends on 1)

The parameter setting method according to claim 1, wherein the test device is connected to a to-be-tested memory, and after setting the memory parameter stored in the non-volatile memory according to the first parameter setting instruction, the parameter setting method further comprises:
obtaining a test result obtained after the test device tests the to-be-tested memory, wherein the test result is obtained after the test device tests the to-be-tested memory according to the set memory parameter.

### Claim 10

A parameter setting apparatus, wherein the parameter setting apparatus comprises:
an obtaining module, configured to obtain first setting values of multiple memory parameters and storage locations of the multiple memory parameters in a non-volatile memory;
a processing module, configured to generate a first parameter setting instruction according to the first setting value and the storage location of each memory parameter; and
a sending module, configured to send the first parameter setting instruction to a test device, so that the test device sets the memory parameter stored at the storage location in the non-volatile memory as the first setting value.

### Claim 11 (depends on 10)

The parameter setting apparatus according to claim 10, wherein the obtaining module is configured to:
obtain first data and second data for each memory parameter, wherein the first data is data stored in the non-volatile memory before the memory parameter is set, and the second data is data stored in the non-volatile memory after the memory parameter is set; and
obtain a storage location of the memory parameter in the non-volatile memory according to the first data and the second data.

### Claim 12 (depends on 11)

The parameter setting apparatus according to claim 11, wherein the obtaining module is configured to:
control the test device to obtain a second setting value of the memory parameter, wherein the second setting value is input by a display interface;
generate a second parameter setting instruction according to the second setting value and a preset instruction template, wherein the second parameter setting instruction is used to set the memory parameter stored in the non-volatile memory; and
obtain the second data stored in the non-volatile memory after the test device executes the second parameter setting instruction.

### Claim 13 (depends on 12)

The parameter setting apparatus according to claim 12, wherein the obtaining module is configured to:
obtain the second data stored in a first memory area and a second memory area after the test device executes the second parameter setting instruction, wherein
the non-volatile memory comprises the first memory area and the second memory area, the first memory area is used to store control parameters, and the second memory area is used to store system variables.

### Claim 14 (depends on 13)

The parameter setting apparatus according to claim 13, wherein the obtaining module is configured to:
obtain the first data stored in the first memory area and the second memory area before the memory parameter is set.

### Claim 15 (depends on 1)

A test system, comprising:
a host computer, wherein the host computer comprises an instruction memory and a processor, the instruction memory is configured to store instructions executable by the processor, and the processor is configured to implement the parameter setting method according to claim 1; and
at least one test device, wherein the test device is connected to the host computer, and the test device comprises a non-volatile memory.

### Claim 16 (depends on 15)

The test system according to claim 15, wherein the non-volatile memory comprises an electrically erasable programmable read only memory, and the electrically erasable programmable read only memory is configured to store a basic input/output system.

### Claim 17 (depends on 15)

The test system according to claim 15, wherein the test system further comprises a to-be-tested memory, and the to-be-tested memory is connected to the test device.

### Claim 18 (depends on 1)

A computer-readable storage medium, wherein the computer-readable storage medium stores computer executable instructions, and the computer executable instructions are executed by a processor to implement the parameter setting method according to claim 1.