Measurement method
AssigneeRenishaw PLC
InventorsJohn Charles OULD, Rose CROSSLAND
Life of this patent
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Abstract
A method of determining a form measurement for a curved feature of an artefact. The method includes a positioning apparatus relatively moving the artefact and a measurement device relative along a curved path in a first direction, to obtain a first set of data points along the surface of the curved feature, and the positioning apparatus relatively moving the artefact and the measurement device other along a curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature. The method further includes using the first and second sets of data points to determine a form measurement for the artefact.
Claims19
A method of determining a form measurement for a curved feature of an artefact, the method comprising:
- i) a positioning apparatus relatively moving the artefact and a measurement device along a curved path in a first direction, to obtain a first set of data points along the surface of the curved feature;
- ii) the positioning apparatus relatively moving the artefact and the measurement device along a curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature;
- and
- iii) using the first and second sets of data points to determine a form measurement for the artefact.
A computer implemented method, comprising:
- taking a first set of data points which were obtained by a measurement device mounted on a positioning apparatus whilst the measurement device and the artefact were moved by the positioning apparatus relative to each other along a curved path in a first direction,
- taking a second set of data points which were obtained by the measurement device whilst the measurement device and the artefact were moved by the positioning apparatus relative to each other along a curved path in a second direction, and
- using the first and second data sets to determine a form measurement for the artefact.
A processing device which is configured to take a first set of data points which were obtained by a measurement device mounted on a positioning apparatus whilst the measurement device and the artefact were moved by the positioning apparatus relative to each other along a curved path in a first direction, and to take a second of data points which were obtained by the measurement device whilst the measurement device and the artefact were moved by the positioning apparatus relative to each other along a curved path in a second direction, and to use the first and second data sets to determine a form measurement for the artefact.
An apparatus comprising a positioning apparatus on which a measurement device and artefact are located, wherein the apparatus is configured to i) cause the positioning apparatus to relatively move the artefact and a measurement device relative along a curved path in a first direction, to obtain a first set of data points along the surface of the curved feature, ii) cause the positioning apparatus to relatively move the artefact and the measurement device other along a curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature, and iii) use the first and second sets of data points to determine a form measurement for the artefact.
Dependencies are inferred from the claim text.