Sensor system, master unit, prediction device, and prediction method

A prediction device predicting an abnormality or a sign of an abnormality of a workpiece, the prediction device comprising:

• an acquisition unit configured to acquire data measured by a first sensor measuring the workpiece;
• and
• a prediction unit configured to input acquired data of the first sensor to a learned model and cause the learned model to output a predicted value,
• wherein the learned model is generated by performing machine learning of a learning model using learning data generated when the data of the first sensor is regarded as input data and data of a second sensor measuring the workpiece in a relatively longer cycle than the first sensor is regarded as label data indicating a property of the input data.

A prediction method of predicting an abnormality or a sign of an abnormality of a workpiece, the prediction method comprising:

• acquiring data measured by a first sensor measuring the workpiece;
• and
• inputting acquired data of the first sensor to a learned model and causing the learned model to output a predicted value,
• wherein the learned model is generated by performing machine learning of a learning model using learning data generated when the data of the first sensor is regarded as input data and data of a second sensor measuring the workpiece in a relatively longer cycle than the first sensor is regarded as label data indicating a property of the input data.