Device and method for determining an effective piezoelectric coefficient of a material

A device for determining at least one effective transverse piezoelectric coefficient (e31eff) of a thin film of a material of a sample, comprising:

• a source of x-rays incident on the sample;
• a detector of x-rays diffracted by the sample;
• a device for positioning the x-ray source and the x-ray detector with respect to the sample;
• a voltage source making contact with the sample;
• a device for controlling the voltage source so as to apply an electric field to the sample during an electrical cycle, the electric field generating a strain of the sample and a stress on the sample;
• a device for measuring a diffraction peak of the x-rays as a function of the electric field applied to the sample during the electrical cycle;
• a processing device configured to determine the transverse piezoelectric coefficient via determination of a radius of curvature of the sample on the basis of the measured diffraction peak.