X-ray unit technology modules and automated application training
AssigneeJohn Bean Technologies Corporation
InventorsJeffrey C. Gill, Amer M. Butt, Richard D. Timperio
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AssigneeJohn Bean Technologies Corporation
InventorsJeffrey C. Gill, Amer M. Butt, Richard D. Timperio
Estimating the term…
A scanner comprises an electromagnetic wave source; and a detector positioned to measure emissions from the electromagnetic wave source, wherein the electromagnetic wave source comprises a first technology, and the electromagnetic wave source is interchangeable with a second electromagnetic wave source comprising a second technology and/or wherein the detector comprises a first technology, and the detector is interchangeable with a second detector comprising a second technology. The scanner can comprise a storage medium having instructions stored thereon to perform a method for training the scanner for an inspection application, the method comprising operating the electromagnetic wave source to generate electromagnetic wave emissions at a plurality of combinations of parameters; moving a conveyor belt to expose product having a plurality of contaminants of different sizes to the emissions generated at more than one combination of parameters; recording attenuated emissions that pass through the product at more than one combination of parameters; and selecting a combination of parameters to use when inspecting for the contaminant.
A scanner, comprising:
A method for training a scanner to perform an inspection application, the method comprising:
A scanner, comprising:
(canceled)
A method for training a scanner to perform an inspection application, the method comprising:
Dependencies are inferred from the claim text.