Reduced impedance variation in a modular 2-terminal terminal contacting electrical measurement system
AssigneeElectro Scientific Industries, Inc.
InventorDoug GARCIA
Life of this patent
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AssigneeElectro Scientific Industries, Inc.
InventorDoug GARCIA
Estimating the term…
An electrical measurement contacting system for use with a component testing system operable to convey devices includes: a first module including a test contact module having a test contact adapted to electrically contact devices conveyed by the component testing system, and a second module including circuitry electrically coupled to the test contact module and operative to perform an electrical measurement on devices conveyed to the test contact. The circuitry is connected, within the second module, to a first conductive path and a second conductive path. The first conductive path and the second conductive path extend into the first module. The first conductive path and the second conductive path are electrically connected to each other and to the test contact module in the first module.
An electrical measurement contacting system for use with a component testing system operable to convey devices, the electrical measurement contacting system comprising:
Dependencies are inferred from the claim text.