Methods and Systems for Automatic Measurements of Optical Systems
AssigneeEyeQue Inc.
InventorsNoam Sapiens, John Serri
Life of this patent
Estimating the term…
Abstract
Disclosed embodiments include means and methods of automatically measuring numerous characteristics of an optical system, such as an eye. Measured or displayed optical properties may include but are not limited to. spherical power, cylinder and axis for astigmatism. Higher order optical aberrations may also be measured. Disclosed embodiments may be used to measure refraction for creating corrective lenses for eyeglasses and contact lenses. Measurements of higher order aberrations of an eye may be used for measuring enhanced correction, accommodation state and range.
Claims45
A method of measuring properties of an optical system, the method comprising the steps of:
- a) projecting an annular collimated beam to the optical system;
- b) using collection optics to capture the annular collimated beam reflected from the optical system to obtain a reflected annular image;
- c) using an analysis of the reflected annular image to derive the properties of the optical system.
A system of measuring properties of an optical system, the system comprising:
- a) an annular collimated beam projected to the optical system;
- b) reflection optics receiving the annual collimated beam as reflected form the optical system;
- c) an analysis of the reflected annular image used to derive the properties of the optical system.
A method of measuring properties of an optical system, the system comprising the steps of:
- a) projecting an illumination to form an annulus input wherein the annulus input is projected to the optical system;
- b) using collection optics to capture a reflection of the annulus input from the optical system to obtain an annulus output image;
- c) obtaining a transfer function to represent the properties of the optical system, the transfer function being derived by deconvolution of the annulus output as compared to the annulus input.
A method of measuring properties of an optical system, the method comprising the steps of:
- a) projecting a predefined image upon a focal plane of the optical system;
- b) using collection optics to obtain a reflected image from the reflection of the predefined image reflected from the focal plane;
- c) using an array/symmetry detector to accept the reflected image from the collection optics;
- d) using the array/symmetry detector to derive the properties of the optical system.
A method of measuring properties of an optical system, the method comprising the steps of:
- a) projecting a predefined image through a deformable lens with a resulting image projected upon a focal plane of the optical system;
- b) using an array detector to measure an image reflected form the optical system;
- c) using the deformable lens to reshape the resulting image projected to the focal plane until the reflected image measured by the array detector comports with the predefined image;
- d) using the final refraction of the deformable lens as the derived optical system properties.
A method of measuring properties of an optical system, the method comprising the steps of:
- a) projecting a predefined image through illumination optics and then a deformable lens with a resulting image projected upon a focal plane of the optical system;
- b) an image reflected from the optical system is passed through a variable lens and a lenslet array with the variable lens and lenslet array incident to an array detector;
- c) the variable lens is varied between images captured by the array detector
- d) an offset of a focal points grid from a predefined ideal grid is captured in each image;
- e) as the deviation for each focal point is obtained for each variable lens value, defocus and astigmatism of the optical system may be derived.
A system of measuring properties of an optical system, the system comprising:
- a) a predefined image projected through a deformable lens with a resulting image projected upon a focal plane of the optical system;
- b) an array detector used to measure an image reflected from the optical system;
- c) the deformable lens used to reshape the resulting image projected to the focal plane until the reflected image measured by the array detector comports with the predefined image;
- d) the final refraction of the deformable lens used as the derived optical system properties.
Dependencies are inferred from the claim text.