Improved reflection mode dynode
AssigneeAdaptas Solutions Pty Ltd
InventorsTOBY SHANLEY, WAYNE SHEILS
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Abstract
A device configured to convert or amplify a particle, the conversion or amplification being reliant on the impact of a particle on a surface of the device causing emission of one or more secondary electrons from the same surface. The device includes a carbon-based layer capable of secondary electron emission upon impact of a particle. The surface may be used to convert, for example, an ion into an electron signal, or an electron signal into an amplified electron signal, such as in conversion or amplification dynodes.
Claims46
A device configured to convert or amplify a particle, the conversion or amplification being reliant on the impact of a particle on a surface of the device causing the emission of one or more secondary electrons from the same surface, wherein the device comprises a carbon-based layer capable of secondary electron emission upon impact of a particle.
The device of claim 2, wherein the device is a conversion dynode or an amplification dynode or a microchannel wafer or a microchannel plate.
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An ion detector, electron multiplier, mass spectrometer, or photomultiplier comprising a device configured to convert or amplify a particle, the conversion or amplification being reliant on the impact of a particle on a surface of the device causing the emission of one or more secondary electrons from the same surface, wherein the device comprises a carbon-based layer capable of secondary electron emission upon impact of a particle.
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A method for fabricating a device configured to convert or amplify a particle, the conversion or amplification being reliant on the impact of a particle on a surface of the device causing the emission of one or more secondary electrons from the same surface, the method comprising providing a substrate, and forming a carbon-based layer on the substrate.
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Dependencies are inferred from the claim text.