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US 2022/0190182 A1Published application
Indirect bandgap, perovskite-based x-ray detector and method
AssigneeKing Abdullah University of Science and Technology
InventorsBin XIN, Iman S. ROQAN
Life of this patent
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Abstract
An X-ray system includes an X-ray generation unit configured to generate X-rays; an X-ray detection unit including at least one X-ray sensor that includes an indirect bandgap, perovskite semiconductor material, the X-ray sensor being configured to record the X-rays; and a control unit that controls a generation of the X-rays and a detection of the X-rays at the X-ray detection unit.
Claims20
An X-ray system comprising:
- an X-ray generation unit configured to generate X-rays;
- an X-ray detection unit including at least one X-ray sensor that includes an indirect bandgap, perovskite semiconductor material, the X-ray sensor being configured to record the X-rays;
- and
- a control unit that controls a generation of the X-rays and a detection of the X-rays at the X-ray detection unit.
1 more element
An X-ray sensor for determining X-ray radiation, the X-ray sensor comprising:
- a substrate;
- an interdigitated contact electrode, IDE, formed on the substrate, the IDE having two trunks and each trunk having plural branches;
- and
- an indirect bandgap, perovskite semiconductor material deposited on the substrate, between the two trunks.
1 more element
A method for recording X-ray radiation, the method comprising:
- sending X ray radiation directly to an indirect bandgap, perovskite semiconductor material, which is deposited on a substrate, between two trunks of an interdigitated contact electrode, IDE;
- applying a current or voltage between the two trunks;
- and
- detecting a change in the current or voltage when the X-ray radiation interacts with the indirect bandgap, perovskite semiconductor material,
- wherein the change is indicative of the X-ray radiation.
2 more elements
Dependencies are inferred from the claim text.