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US 2022/0190022 A1Published application
Image sensors
AssigneeSamsung Electronics Co., Ltd.
InventorsMIN JANG, JUNGCHAK AHN, JUNSUNG PARK, YOUNGGU JIN
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Abstract
An image sensor includes a device isolation layer disposed in a substrate and defining pixel regions, and a grid pattern on a surface of the substrate. The grid pattern overlaps the device isolation layer between adjacent pixel regions in a direction perpendicular to the surface. The grid pattern has a width less than a width of the device isolation layer.
Claims20
An image sensor, comprising:
- an isolation layer disposed in a substrate and surrounding at least partially a photo conversion region;
- a grid pattern disposed over the isolation layer and including a upper portion and a lower portion being contact with the upper portion;
- a refractive fence disposed on and being contact with the upper portion;
- a color filter surrounded by the grid pattern and the refractive fence;
- and
- a micro-lens on the color filter,
- wherein a material of the upper portion of the grid pattern is different from a material of the lower portion of the grid pattern, and
- wherein a refractive index of the refractive fence is less than a refractive index of the grid pattern.
5 more elements
An image sensor, comprising:
- an isolation layer disposed in a substrate and surrounding at least partially a photo conversion region;
- a grid pattern disposed over the isolation layer and including a upper portion and a lower portion being contact with the upper portion;
- a refractive fence disposed on and being contact with the upper portion;
- a color filter surrounded by the grid pattern and the refractive fence;
- and
- a micro-lens on the color filter,
- wherein the upper portion of the grid pattern and the lower portion of the grid pattern includes different metal materials,
- wherein a height of the refraction fence is at least half the height of the color filter, and
- wherein a height of the grid pattern is less than half the height of the color filter.
6 more elements
A manufacturing method of an image sensor, comprising:
- providing a semiconductor substrate;
- forming an internal structural features in the substrate, the internal structural features including a plurality of pixels and a and a isolation layer defining and isolating each pixels;
- forming a interconnect line structure on a first surface the substrate;
- forming a first metal layer, a second metal layer, a hardmask layer and a photomask pattern sequentially on a second surface of the semiconductor substrate opposed to the first surface of the semiconductor substrate;
- forming a hardmask pattern by etching the hardmask layer using the photomask pattern as a first etching mask;
- removing the photomask pattern;
- forming a grid pattern by etching the first and second metal layers using the hardmask pattern as a second etching mask;
- and
- forming a color filter such that at least part of the color filter is surrounded by the grid pattern, and
- wherein the grid pattern includes a top portion formed from the second metal layer and a bottom portion formed from the first metal layer, the top portion is being contact with the bottom portion and the second metal layer includes a metal material different from that of the first metal layer.
7 more elements
Dependencies are inferred from the claim text.