Light irradiation type heat treatment method and heat treatment apparatus
AssigneeSCREEN Holdings Co., Ltd.
InventorsAkitsugu UEDA, Kazuhiko FUSE
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AssigneeSCREEN Holdings Co., Ltd.
InventorsAkitsugu UEDA, Kazuhiko FUSE
Estimating the term…
A silicon semiconductor wafer is transported into a chamber, and preheating of the semiconductor wafer is started in a nitrogen atmosphere by irradiation with light from halogen lamps. When the temperature of the semiconductor wafer reaches a predetermined switching temperature in the course of the preheating, oxygen gas is supplied into the chamber to change the atmosphere within the chamber from the nitrogen atmosphere to an oxygen atmosphere. Thereafter, a front surface of the semiconductor wafer is heated for an extremely short time period by flash irradiation. Oxidation is suppressed when the temperature of the semiconductor wafer is relatively low below the switching temperature, and is caused after the temperature of the semiconductor wafer becomes relatively high. As a result, a dense, thin oxide film having good properties with fewer defects at an interface with a silicon base layer is formed on the front surface of the semiconductor wafer.
A method of irradiating a substrate with light to heat the substrate, thereby forming an oxide film, said method comprising the steps of:
A method of irradiating a substrate with light to heat the substrate, thereby forming an oxide film, said method comprising the steps of:
A method of irradiating a substrate with light to heat the substrate, thereby forming an oxide film, said method comprising the steps of:
A heat treatment apparatus for irradiating a substrate with light to heat the substrate, thereby forming an oxide film, said heat treatment apparatus comprising:
A heat treatment apparatus for irradiating a substrate with light to heat the substrate, thereby forming an oxide film, said heat treatment apparatus comprising:
A heat treatment apparatus for irradiating a substrate with light to heat the substrate, thereby forming an oxide film, said heat treatment apparatus comprising:
Dependencies are inferred from the claim text.