Method for microscopic image generation and system for same
AssigneeLeica Mikrosysteme GmbH
InventorPeer Oliver KELLERMANN
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Abstract
The present invention concerns a method and a system for imaging at least a part of a specimen by means of two microscopy imaging methods, where a surface (11) of the specimen (10) is imaged by means of a first microscopy imaging method, where a replica (25) of the surface (11) to be imaged by means of the first microscopy imaging method is produced and this replica (25) is simultaneously imaged by means of a second microscopy imaging method, where the images produced by means of the first and the second microscopy imaging methods are overlaid at the correct scale.
Claims22
A method for imaging at least a part of a specimen, the method comprising:
- imaging a surface (11) of the specimen (10) by a first microscopy imaging method to generate a first image;
- producing a replica (25) of the surface (11);
- imaging the replica (25) by a second microscopy imaging method to generate a second image, where the first and the second microscopy imaging methods take place simultaneously;
- and
- overlaying the first and the second images at a correct scale.
A system for imaging at least a part of a specimen by means of two microscopy imaging methods, the system comprising:
- a first microscope (100) configured for generating a first image of a surface (11) of the specimen (10) by a first microscopy imaging method,
- a second microscope (200) configured for generating a second image of a replica (25) of the surface (11) of the specimen (10) by a second microscopy imaging method, and
- an image overlaying system (500) configured for true-to-scale overlaying of the first image and the second image,
- wherein the system is configured such that the first and the second microscopy imaging methods take place simultaneously.
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Dependencies are inferred from the claim text.