Determining threshold values for voltage distribution metrics in memory system
AssigneeMicron Technology, Inc.
InventorsVamsi Pavan Rayaprolu, Christopher M. Smitchger
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Abstract
Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including determining a voltage distribution metric associated with a at least part of a block of the memory device; determining a threshold value for the voltage distribution metric associated with the block; and responsive to determining that the voltage distribution metric exceeds the threshold value, performing a media management operation with respect to the block.
Claims20
A system comprising:
- a memory device;
- and
- a processing device, operatively coupled to the memory device, to perform operations comprising:
- determining a value of a data state metric associated with data stored on a part of a block of the memory device;
- responsive to the value of the data state metric satisfying a first threshold criterion, determining a first voltage distribution metric associated with at least the part of the block;
- responsive to determining that the first voltage distribution metric satisfies a second threshold criterion, determining second voltage distribution metric associated with the at least part of the block;
- and
- responsive to determining that the second voltage distribution metric satisfies a third threshold criterion, performing a media management operation to relocate the data to a new block of the memory device.
A method, comprising:
- determining, by a processing device, a value of a data state metric associated with data stored on a part of a block of the memory device;
- responsive to the value of the data state metric satisfying a first threshold criterion, determining, a voltage distribution metric associated with at least the part of the block;
- responsive to determining that the first voltage distribution metric satisfies a second threshold criterion, determining second voltage distribution metric associated with the at least part of the block;
- and
- responsive to determining that the second voltage distribution metric satisfies a third threshold criterion, performing a media management operation to relocate the data to a new block of the memory device.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device operatively coupled to a memory, performs operations comprising:
- determining a value of a data state metric associated with data stored on a part of a block of the memory device;
- responsive to the value of the data state metric satisfying a first threshold criterion, determining a first voltage distribution metric associated with at least the part of the block;
- responsive to determining that the first voltage distribution metric satisfies a second threshold criterion, determining second voltage distribution metric associated with the at least part of the block;
- and
- responsive to determining that the second voltage distribution metric satisfies a third threshold criterion, performing a media management operation to relocate the data to a new block of the memory device.
Dependencies are inferred from the claim text.