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US 2022/0189357 A1Published application
Pixel structure for repairing defects for micro device integrated systems
AssigneeVueReal Inc.
InventorGHOLAMREZA CHAJI
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Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Claims10
A method of testing a device on a substrate, the method comprising:
- providing a capacitive coupling between a temporary external electrode and a floating contact of the device to stimulate the device and extracting different device parameters from a response generated by the coupling;
- and removing the temporary external electrode.
Dependencies are inferred from the claim text.