Data analysis apparatus, method and system
AssigneeKabushiki Kaisha Toshiba
InventorsWataru Watanabe, Takayuki Itoh, Jumpei Ando, Keisuke Kawauchi, Toshiyuki Ono
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Abstract
According to one embodiment, a data analysis apparatus includes a processor. The processor acquires, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product. The processor calculates, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.
Claims19
A data analysis apparatus comprising a processor configured to:
- acquire, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product;
- and
- calculate, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.
A data analysis method comprising:
- acquiring, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product;
- and
- calculating, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.
A data analysis system comprising a data storage apparatus, a data analysis apparatus and a display apparatus,
- the data storage apparatus configured to store, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product,
- the data analysis apparatus comprising a processor configured to:
- acquire the manufacturing data from the data storage apparatus;
- and
- calculate, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition, the display apparatus configured to display information concerning the state data in a first display region, and to display information concerning the index value in a second display region for each manufacturing condition.
Dependencies are inferred from the claim text.