Adjusting scan event thresholds to mitigate memory errors

A method comprising:

• skewing, by a processing device, a first read count value for a first group of memory cells of a memory device from a first actual read count value of the first group of memory cells;
• triggering, by the processing device, at least one of a first scan event or a first fold event for the first group of memory cells based on the skewed first read count value and an event threshold;
• and
• triggering, by the processing device, at least one of a second scan event or a second fold event for a second group of memory cells of the memory device based on a second read count value and the event threshold, the second read count value comprising a second actual read count value for the second group of memory cells.

At least one non-transitory machine-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

• skewing a first read count value for a first group of memory cells of a memory device from a first actual read count value of the first group of memory cells;
• triggering at least one of a first scan event or a first fold event for the first group of memory cells based on the skewed first read count value and an event threshold;
• and
• triggering at least one of a second scan event or a second fold event for a second group of memory cells of the memory device based on a second read count value and the event threshold, the second read count value comprising a second actual read count value for the second group of memory cells.