Background memory scan block selection
AssigneeMicron Technology, Inc.
InventorsAlex J. Wesenberg, Johnny A. Lam, Michael Winterfeld
Life of this patent
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Abstract
The memory sub-systems of the present disclosure selects, for memory scans, a memory block which has a highest page fill ratio. In one embodiment, the memory sub-system identifies a number of block stripes located on a logical unit (LU) identified by a logical unit number (LUN), where the LU is one of a plurality of LUs of a memory device. The sub-system determines a fill ratio for each of the plurality of block stripes. The sub-system selects, among the block stripes, a block stripe with a highest fill ratio. The sub-system identifies, from the selected block stripe, a memory block of the LU. The sub-system performs a memory scan operation on the memory block of the memory device.
Claims20
A system comprising:
- a plurality of memory devices;
- and
- a processing device, operatively coupled with the plurality of memory devices, to perform operations comprising:
- identifying a plurality of block stripes located on a logical unit (LU) identified by a logical unit number (LUN), wherein the LU is one of a plurality of LUs of a memory device;
- determining a fill ratio for each of the plurality of block stripes;
- selecting, among the plurality of block stripes, a block stripe with a highest fill ratio;
- identifying, from the selected block stripe, a memory block of the LU;
- and
- performing a memory scan operation on the memory block of the memory device.
A method, comprising:
- identifying a range of memory addresses that stores fill threshold index (FTI) metadata for a plurality of block stripes located on a logical unit (LU), the LU identified by a logical unit number (LUN);
- determining, within the range of memory addresses, a memory address corresponding to a highest FTI;
- determining a block stripe based on the memory address;
- identifying, from the block stripe, a memory block of the LU;
- and
- performing a memory scan operation on the memory block of the memory device.
A non-transitory machine-readable storage medium including instructions that, when accessed by a processing device, cause the processing device to execution one or more operations, comprising:
- identifying a plurality of block stripes located on a logical unit (LU) identified by a logical unit number (LUN), wherein the LU is one of a plurality of LUs of a memory device;
- determining a fill ratio for each of the plurality of block stripes;
- selecting, among the plurality of block stripes, a block stripe with a highest fill ratio;
- identifying, from the selected block stripe, a memory block of the LU;
- and
- performing a memory scan operation on the memory block of the memory device.
Dependencies are inferred from the claim text.