Waveform measuring method
AssigneeNanjing Macrotest Semiconductoe Technology Co., Ltd.
InventorGUOLIANG MAO
Life of this patent
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AssigneeNanjing Macrotest Semiconductoe Technology Co., Ltd.
InventorGUOLIANG MAO
Estimating the term…
The present invention discloses a waveform measuring method. It converts the waveform to be measured into two corresponding square waves by two comparators. When the hardware logic device receives the signal from the host computer software to start waveform acquisition, it acquires two square waves and simultaneously starts the counter to count with a fixed high frequency clock. When the waveform is flipped, if the count value is less than the set filter value, the waveform is filtered out; if the count value is greater than the set filter value, the hardware logic device saves the waveform and count value and clears the counter to zero. The number of waveform flips is judged whether the set value is reached, and if not, the count is recounted; if it is reached, the waveform acquisition is stopped, and then the waveform and count values saved by the hardware logic device are read and optimized by the host computer software. According to the test requirements, the corresponding algorithm is executed, and the calculation results are output. It improves the accuracy and precision of the measurement and increases the flexibility of the measuring method.
A waveform measuring method, characterized in that it comprises:
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