Sample mounting system for an x-ray analysis apparatus
AssigneeMalvern Panalytical Limited
InventorsJaap BOKSEM, Detlef BECKERS
Life of this patent
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Abstract
The sample mounting system comprises a sample holder and a sample stage having a platform for supporting the sample holder. The sample can be fixed to the sample holder by a mount. The sample holder comprises a holder reference portion, which co-operates with a corresponding reference portion of the sample stage (the stage reference portion) to align the sample holder with the sample stage. When the sample holder is positioned on the platform such that the stage reference portion and the holder reference portion engage each other, the sample holder is aligned with the sample stage.
Claims15
A sample mounting system (10) for an X-ray analysis apparatus, the sample mounting system comprising:
- a sample holder (1) comprising a mount (9) for fixing the sample on an upper surface of the sample holder, the sample holder further comprising a holder reference portion (15);
- and
- a sample stage (3) comprising a platform (7) for supporting the sample holder, the sample stage comprising a stage reference portion (13) for co-operating with the holder reference portion (15) to locate the sample holder on the platform, wherein the sample holder (1) and the sample stage (3) have an aligned configuration, in which the sample holder (1) is positioned on the platform (7) such that the stage reference portion (13) and the holder reference portion (15) engage each other.
Dependencies are inferred from the claim text.