Surface-based luminescence measurement substrate
AssigneeEcole Polytechnique Federale De Lausanne (Epfl)
InventorsNicolas DESCHARMES, Raphaël BARBEY
Life of this patent
Estimating the term…
Abstract
Surface-based measurement substrate including: At least one optical cavity layer; a first optical mirror and a second optical mirror, the first and second optical mirrors enclosing the optical cavity layer and defining an optical cavity, the first optical mirror and the second optical mirror are attached or fixed to the optical cavity layer to sandwich the optical cavity layer between the first and second mirrors; and an interface layer or interface coating provided on the first mirror or the second mirror, the interface layer or coating being configured to receive or hold at least one entity comprising at least one electromagnetic radiation emitting marker.
Claims21
1-59. (canceled)
Surface-based measurement substrate including:
- at least one optical cavity layer;
- a first optical mirror and a second optical mirror, the first and second optical mirror enclosing the optical cavity layer and defining an optical cavity, the first optical mirror and the second optical mirror are attached or fixed to the optical cavity layer to sandwich the optical cavity layer between the first and second mirrors;
- and
- an interface layer or interface coating provided on the first mirror or the second mirror, the interface layer or coating being configured to receive or hold at least one entity comprising at least one electromagnetic radiation emitting marker.
Surface-based measurement substrate including:
- at least one optical cavity layer;
- a first optical mirror and a second optical mirror, the first and second optical mirrors enclosing the optical cavity layer and defining an optical cavity, the first optical mirror and the second optical mirror are attached or fixed to the optical cavity layer to sandwich the optical cavity layer between the first and second mirrors;
- and
- wherein the at least one optical cavity layer delimits a layer thickness defining at least one spectral feature or spectral dip in reflectance from the measurement substrate that is offset in wavelength from an emission wavelength of the at least one electromagnetic radiation emitting marker or a plurality of electromagnetic radiation emitting markers.
Surface-based measurement substrate including:
- at least one optical cavity layer;
- a first optical mirror and a second optical mirror, the first and second optical mirrors enclosing the optical cavity layer and defining an optical cavity, the first optical mirror and the second optical mirror are attached or fixed to the optical cavity layer to sandwich the optical cavity layer between the first and second mirrors.
Dependencies are inferred from the claim text.