Slope, p-component and s-component measurement
AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
Life of this patent
Estimating the term…
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AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
Estimating the term…
An optical scanning system including a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scanned light beam is created by focusing light reflected from the sample and the de-scan lens is located approximately one focal length of the de-scan lens from an irradiation location where the light beam irradiates the sample, a focusing lens that is configured to output a focused light beam, a collimating lens that is configured to output a collimated light beam, a polarizing beam splitter that is configured to be irradiated by the collimated light beam, and a detector that is configured to be irradiated by at least a portion of the collimated light beam that is not reflected by the polarizing beam splitter.
An optical scanning system, comprising:
Dependencies are inferred from the claim text.